| Immagine |
Modello di prodotti |
Produttori |
Descrizione |
vista |
 |
SY10EP16UMG-TR |
Microchip Technology |
IC RCVR HS DIFF 2.5/3.3V 8-MLF |
Inchiesta |
 |
SSTUP32866EC/G,518 |
NXP USA Inc. |
IC REG BUFFER CONFIG 96LFBGA |
Inchiesta |
 |
SSTUG32865ET/S,518 |
NXP USA Inc. |
IC BUFFER 1.8V 28BIT 160-TFBGA |
Inchiesta |
 |
SY100EL16VAZG-TR |
Microchip Technology |
IC RCVR DIFF 3.3/5V 8-SOIC |
Inchiesta |
 |
SSTVF16857DGV,118 |
NXP USA Inc. |
IC REG DRIVER 14BIT SSTL 48TSSOP |
Inchiesta |
 |
MC100EP16VCDG |
ON Semiconductor |
IC RCVR/DRVR ECL DIFF 5V 8SOIC |
Inchiesta |
 |
SN74LVTH182646APM |
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
Inchiesta |
|
MC10EP116FA |
ON Semiconductor |
IC RCVR/DRVR HEX 6BIT DFF 32LQFP |
Inchiesta |
 |
IDT74SSTU32864ABFG8 |
IDT, Integrated Device Technology Inc |
IC BUFFER 1:1/1:2 96-LFBGA |
Inchiesta |
|
SN74LVCE161284VR |
Texas Instruments |
IC IEEE STD 1284 TXRX 48-TVSOP |
Inchiesta |
 |
SY100EL16VAKC TR |
Microchip Technology |
IC RCVR DIFF 5V/3.3V 8-MSOP |
Inchiesta |
|
N74F656AD,623 |
NXP USA Inc. |
IC BUFFER/DRIVER OCTAL 24SOIC |
Inchiesta |
|
SN74ABT8652DWRE4 |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
Inchiesta |
|
74GTLP2034DGVRG4 |
Texas Instruments |
IC LVTTL/GTLP ADJ TXRX 48TVSOP |
Inchiesta |
|
SSTU32865ET,551 |
NXP USA Inc. |
IC BUFFER 1.8V 28BIT SOT802-1 |
Inchiesta |
|
SY10EP16UZG |
Microchip Technology |
IC RCVR HS DIFF 2.5/3.3V 8-SOIC |
Inchiesta |
|
SY10EL16VEZC TR |
Microchip Technology |
IC RCVR DIFF 5V/3.3V 8-SOIC |
Inchiesta |
 |
FM3560M20X |
Fairchild/ON Semiconductor |
MULTIPLEXER 4/5BIT 2WIRE 20SOIC |
Inchiesta |
|
SY100EL16VEZI-TR |
Microchip Technology |
IC RCVR DIFF 5V/3.3V 8-SOIC |
Inchiesta |
 |
MC10H332FNR2G |
ON Semiconductor |
IC DRIVER/RCVR DUAL BUS 20PLCC |
Inchiesta |
|
SSTUF32864BHLF |
IDT, Integrated Device Technology Inc |
IC REGIST BUFF 25BIT DDR2 96-BGA |
Inchiesta |
|
SN74SSTU32864CZKER |
Texas Instruments |
IC 25BIT CONFIG REG BUFF 96-BGA |
Inchiesta |
|
SN74ABT18504PMG4 |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
Inchiesta |
|
SN74ABT8996DW |
Texas Instruments |
IC ADDRESSABLE SCAN PORT 24-SOIC |
Inchiesta |
|
SN74F1056DR |
Texas Instruments |
IC ARRAY BUS-TERM 8BIT 16-SOIC |
Inchiesta |
 |
SY10E212JZ |
Microchip Technology |
IC REGISTER 3BIT SCAN 28-PLCC |
Inchiesta |
 |
NB4N855SMR4G |
ON Semiconductor |
IC DRVR/RCVR/BUFF/XLATOR MICRO10 |
Inchiesta |
|
74GTLP2034DGGRE4 |
Texas Instruments |
IC 8BIT REGIST TXRX 48-TSSOP |
Inchiesta |
|
SY100EL16VSKG |
Microchip Technology |
IC RCVR DIFF 3.3/5V 8-MSOP |
Inchiesta |
|
SN74FB2033KRCR |
Texas Instruments |
IC REGISTERED TXRX 8BIT 52-QFP |
Inchiesta |
|
SSTUA32S865ET/G,55 |
NXP USA Inc. |
IC BUFFER 1.8V 28BIT SOT802 |
Inchiesta |
|
SY100EL16VFZC |
Microchip Technology |
IC RCVR DIFF 5V/3.3V 8-SOIC |
Inchiesta |
|
SSTUAF32868AHLFT |
IDT, Integrated Device Technology Inc |
IC REGIST BUFF 25BIT DDR2 176BGA |
Inchiesta |
|
SSTVA16857AGT |
IDT, Integrated Device Technology Inc |
IC REGIST BUFF 14BIT DDR 48TSSOP |
Inchiesta |
|
SY10EL16VAZI-TR |
Microchip Technology |
IC RCVR DIFF 5V/3.3V 8-SOIC |
Inchiesta |
|
SN74LS31DR |
Texas Instruments |
IC HEX DELAY ELEMENT 16-SOIC |
Inchiesta |
|
SN74GTLP22034DGGR |
Texas Instruments |
IC REG TXRX LVTTL-GTLP 48-TSSOP |
Inchiesta |
|
SN74LS283DRG4 |
Texas Instruments |
IC BINARY FULL ADDER 16SOIC |
Inchiesta |
|
SY100EL16VCKC TR |
Microchip Technology |
IC RCVR DIFF 5V/3.3V 8-MSOP |
Inchiesta |
|
SN74TVC3010PWG4 |
Texas Instruments |
IC 10BIT VOLTAGE CLAMP 24-TSSOP |
Inchiesta |
|
SSTUA32866EC,551 |
NXP USA Inc. |
IC BUFFER 1.8V 25BIT SOT536 |
Inchiesta |
|
SSTVF16857AGT |
IDT, Integrated Device Technology Inc |
IC DDR REGISTER 48-TSSOP |
Inchiesta |
|
SN74ABT8646DWR |
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
Inchiesta |
|
SY89206VMI-TR |
Microchip Technology |
IC RECEIVER/BUFFER 3.3V/5V 8-MLF |
Inchiesta |
 |
MC100EP16VBDTG |
ON Semiconductor |
IC RCVR/DRVR ECL DIFF 5V 8TSSOP |
Inchiesta |
|
SSTUG32866EC/G,518 |
NXP USA Inc. |
IC BUFFER 1.8V 25BIT 96-LFBGA |
Inchiesta |
|
CD74ACT283E |
Texas Instruments |
IC 4-BIT BIN FILL ADDER 16-DIP |
Inchiesta |
|
SY100E116JI-TR |
Microchip Technology |
IC LINE RCVR QUINT DIFF 28-PLCC |
Inchiesta |
|
SN74ABT18504PMRG4 |
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
Inchiesta |
|
SY100EL16VFZG-TR |
Microchip Technology |
IC RCVR DIFF 3.3/5V 8-SOIC |
Inchiesta |
