Acquistare SN74BCT8244ADW con BYCHPS
Acquista con garanzia
SN74BCT8244ADW
- Modello di prodotti:
- SN74BCT8244ADW
- fabbricante:
- Descrizione:
- IC SCAN TEST DEVICE BUFF 24-SOIC
- Stato Lead senza piombo / RoHS:
- Senza piombo / RoHS conforme
- quantità disponibile:
- 19049 Pieces
- Scheda dati:
- SN74BCT8244ADW.pdf
introduzione
BYCHIPS è il distributore di calze per SN74BCT8244ADW, abbiamo le scorte per la spedizione immediata e anche disponibili per la fornitura di molto tempo. Vi preghiamo di inviarci il vostro piano di acquisto per SN74BCT8244ADW via email, ti daremo il miglior prezzo secondo il tuo piano.
Specifiche
| Tensione di alimentazione: | 4.5 V ~ 5.5 V |
|---|---|
| Contenitore dispositivo fornitore: | 24-SOIC |
| Serie: | 74BCT |
| imballaggio: | Tube |
| Contenitore / involucro: | 24-SOIC (0.295", 7.50mm Width) |
| Altri nomi: | SN74BCT8244ADWG4 SN74BCT8244ADWG4-ND |
| temperatura di esercizio: | 0°C ~ 70°C |
| Numero di bit: | 8 |
| Tipo montaggio: | Surface Mount |
| Livello di sensibilità umidità (MSL): | 1 (Unlimited) |
| Produttore tempi di consegna standard: | 6 Weeks |
| codice articolo del costruttore: | SN74BCT8244ADW |
| Tipo Logic: | Scan Test Device with Buffers |
| Descrizione espansione: | Scan Test Device with Buffers IC 24-SOIC |
| Descrizione: | IC SCAN TEST DEVICE BUFF 24-SOIC |
| Email: | [email protected] |
Parti relative per SN74BCT8244ADW
| Immagine | Modello di prodotti | Produttori | Descrizione | vista |
|---|---|---|---|---|
|
SN74BCT8244ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Inchiesta |
|
SN74BCT8240ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Inchiesta |
|
SN74BCT8245ANTG4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Inchiesta |
|
SN74BCT8240ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8240ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8245ADWR | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Inchiesta |
|
SN74BCT8244ADWE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8244ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Inchiesta |
|
SN74BCT8245ADW | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Inchiesta |
|
SN74BCT8240ADW | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8245ANT | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Inchiesta |
|
SN74BCT8240ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Inchiesta |
|
SN74BCT8244ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8240ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Inchiesta |
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