Acquistare SN74BCT8245ADWR con BYCHPS
Acquista con garanzia
SN74BCT8245ADWR
- Modello di prodotti:
- SN74BCT8245ADWR
- fabbricante:
- Descrizione:
- IC SCAN TEST DEVICE TXRX 24-SOIC
- Stato Lead senza piombo / RoHS:
- Senza piombo / RoHS conforme
- quantità disponibile:
- 17278 Pieces
- Scheda dati:
- SN74BCT8245ADWR.pdf
introduzione
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Specifiche
| Tensione di alimentazione: | 4.5 V ~ 5.5 V |
|---|---|
| Contenitore dispositivo fornitore: | 24-SOIC |
| Serie: | 74BCT |
| imballaggio: | Tape & Reel (TR) |
| Contenitore / involucro: | 24-SOIC (0.295", 7.50mm Width) |
| Altri nomi: | SN74BCT8245ADWRE4 SN74BCT8245ADWRE4-ND SN74BCT8245ADWRG4 SN74BCT8245ADWRG4-ND |
| temperatura di esercizio: | 0°C ~ 70°C |
| Numero di bit: | 8 |
| Tipo montaggio: | Surface Mount |
| Livello di sensibilità umidità (MSL): | 1 (Unlimited) |
| Produttore tempi di consegna standard: | 6 Weeks |
| codice articolo del costruttore: | SN74BCT8245ADWR |
| Tipo Logic: | Scan Test Device with Bus Transceivers |
| Descrizione espansione: | Scan Test Device with Bus Transceivers IC 24-SOIC |
| Descrizione: | IC SCAN TEST DEVICE TXRX 24-SOIC |
| Email: | [email protected] |
Parti relative per SN74BCT8245ADWR
| Immagine | Modello di prodotti | Produttori | Descrizione | vista |
|---|---|---|---|---|
|
SN74BCT8244ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Inchiesta |
|
SN74BCT8244ADW | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8240ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8245ADW | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Inchiesta |
|
SN74BCT8240ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Inchiesta |
|
SN74BCT8244ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8245ANTG4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Inchiesta |
|
SN74BCT8245ANT | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Inchiesta |
|
SN74BCT8244ADWE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8240ADW | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8240ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Inchiesta |
|
SN74BCT8244ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Inchiesta |
|
SN74BCT8240ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Inchiesta |
|
SN74BCT8240ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Inchiesta |
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